XRF
2021.06.22본문
"Non-destructive analysis, laser-based analysis location adjustment.
Resolution: 149eV FWHM at 5.9Kev
Feasible analysis of atomic substances."
Resolution: 149eV FWHM at 5.9Kev
Feasible analysis of atomic substances."
- PrevLighting Booth 21.06.22
- NextElectric furnace 21.06.22